Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo
"Estimation of Delay Test Quality and Its Application to Test Generation"
IPSJ Transactions on System LSI Design Methodology, Vol. 1, pp.104-115, Aug. 2008.

X. Wen, K. Miyase, T. Suzuki, S. Kajiihara, L.-T. Wang, K. K. Saluja, and K. Kinoshita
"Low-Capture-Switching-Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing"
Journal of Electronic Testing: Theory and Applications, Volume 24, Issue 4, pp.379-391, Aug 2008.

Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara
"A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits"
IEICE Transactions on Information and Systems, Vol. E91-D, No. 3, pp. 667-674, March 2008.

Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy
"On Detection of Bridge Defects with Stuck-at Tests"
IEICE Transactions on Information and Systems, Vol. E91-D, No. 3, pp. 683-689, March 2008.


H. Furukawa, X. Wen, K. Miyase, Y. Yamato, S. Kajihara, P. Girard, L. T. Wang, M. Tehranipoor
"CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing"
IEEE Asian Test Sympo, Nov. 2008. (Accepted)

K. Miyase, K. Noda, H. Ito, K. Hatayama, T. Aikyo, Y. Yamato, H. Furukawa, X. Wen, S. Kajihara
"Effective IR-Drop Reduction in At-Speed Scan Testing Using Distribution-Controlling X-Identification"
IEEE/ACM International Conference on Computer-Aided Design, Nov. 2008. (Accepted)

X. Wen, K. Miyase, S. Kajihara, H. Furukawa, Y. Yamato, A. Takashima, K. Noda, H. Ito, K. Hatayama
"A Capture-Safe Test Generation Scheme for At-Speed Scan Testing"
Proc. IEEE European Test Symp, pp. 55-60, Verbania, Italy, May 2008.


電子情報通信学会 基礎・境界ソサイエティ誌,pp.71-77, Vol. 1, Num. 3, Jan. 2008.


アドバンテスト展2008 テクニカルセミナー, 平成20年6月4日

Xiaoqing Wen
"Power issues in VLSI/SOC testing: challenges and solutions"
CTC(China Test Conference) 2008, May 2008.

Xiaoqing Wen
"Challenges and Chances in Deep-Submicron LSI Testing"
Electrical and Computer Engineering, University of Connecticut, April 25, 2008

Xiaoqing Wen, 他
"Test Strategies for Low Power Devices (Power Issues during Test)"
Design, Automation & Test in Europe(DATE'08), Hot-Topic Session, pp. 11-18, March 12, 2008.

Xiaoqing Wen, 他
"Power-Aware Testing and Test Strategies for Low Power Devices"
Design, Automation & Test in Europe(DATE'08), Half-Day Tutorial, March 10, 2008.


第59回FTC研究会,セッション1,July 2008

電子情報通信学会技術研究報告,DC2008-17,pp.35-39,June 2008.

第58回FTC研究会,セッション6,Jan 2008

Copyright(C) 2008 Kajihara & Wen Lab. , All rights reserved.