Publications
>2008 | >2007 | >2006 | >`2005 | > |
@
uVLSI Test Principles and Architectures: Design
for Testabilityv
L.-T. Wang, C.-W. Wu, and X. Wen
(Editors)
Morgan Kaufmann, San Francisco, July
2006.@
@
uLow-Aware Testing and Test Strategies for Low
Power Devicesv
Patrick Girard, Nicola Nicolici, and
Xiaoqing Wen (Editors)
Springer, New York, Oct.
2009.@
@
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2005.@
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