Publications

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@ uVLSI Test Principles and Architectures: Design for Testabilityv
L.-T. Wang, C.-W. Wu, and X. Wen (Editors) 
Morgan Kaufmann, San Francisco, July 2006.
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@ uLow-Aware Testing and Test Strategies for Low Power Devicesv
Patrick Girard, Nicola Nicolici, and  Xiaoqing Wen (Editors)
Springer, New York, Oct. 2009.
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@ uƒfƒBƒyƒ“ƒ_ƒuƒ‹ƒVƒXƒeƒ€\‚M—ŠƒVƒXƒeƒ€ŽภŒป‚ฬ‚ฝ‚฿‚ฬ‘ฯŒฬแEŒŸุEƒeƒXƒg‹Zpv
•ฤ“c —F—m, ŠŒด ฝŽi, “y‰ฎ ’BO ’˜
‹ค—งo”ล, 2005.
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