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‰· ‹ÅÂ (Xiaoqing Wen)


Ž–¼‰· ‹ÅÂ (Xiaoqing Wen)
Š‘®‹ãBH‹Æ‘åŠw‘åŠw‰@ î•ñHŠwŒ¤‹†‰@ î•ñEƒlƒbƒgƒ[ƒNHŠwŒ¤‹†Œn
—X•Ö”ԍ†820-8502
ŠÝ’n•Ÿ‰ªŒ§”Ñ’ËŽsì’Ã680-4
Phone0948-29-7891
Fax0948-29-7651
e-mailwen (at) csn.kyutech.ac.jp
Webhttps://www.vlab.cse.kyutech.ac.jp/~wen/index.htm

—š—ð

1986”N´‰Ø‘åŠw ŒvŽZ‹@‰ÈŠw‹Zp ‘²‹Æ
1990”NL“‡‘åŠw HŠwŒ¤‹†‰È î•ñHŠw(CŽm) C—¹
1993”N‘åã‘åŠw HŠwŒ¤‹†‰È ‰ž—p•¨—Šw(”ŽŽm) C—¹
1993-1997”NH“c‘åŠw HŠwŽ‘Œ¹Šw•” î•ñHŠw‰È uŽt
1995-1996”N•Ä‘ ƒEƒBƒXƒRƒ“ƒVƒ“‘åŠw “d‹CŒvŽZ‹@HŠw‰È ‹qˆõŒ¤‹†ˆõ
1998-2003”N•Ä‘ SynTestTechnologiesŽÐ Å‚‹ZpÓ”CŽÒiCTOj
2004-2007”N‹ãBH‹Æ‘åŠw‘åŠw‰@ î•ñHŠwŒ¤‹†‰È •‹³Žö
2007-Œ»Ý‹ãBH‹Æ‘åŠw‘åŠw‰@ î•ñHŠwŒ¤‹†‰È ‹³Žö

ŽóÜ

1993”N5ŒŽ11“úî•ñˆ—Šw‰ï“Œ–kŽx•” •½¬5”N“xŒ¤‹†§—ãÜ
2007”N10ŒŽ12“úSeventh IEEE Workshop on RTL and High Level Testing Å—DG˜_•¶Ü
2009”N3ŒŽ17“ú“dŽqî•ñ’ʐMŠw‰ï •½¬20”N“xî•ñEƒVƒXƒeƒ€ƒ\ƒTƒCƒGƒeƒB˜_•¶Ü
2012”N1ŒŽ1“úIEEE (Institute of Electrical and Electronics Engineers) ƒtƒFƒ[

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