Profile
‰· ‹ÅÂ (Xiaoqing Wen)
Ž–¼ | ‰· ‹ÅÂ (Xiaoqing Wen) |
Š‘® | ‹ãBH‹Æ‘åŠw‘åŠw‰@ î•ñHŠwŒ¤‹†‰@ î•ñEƒlƒbƒgƒ[ƒNHŠwŒ¤‹†Œn |
—X•Ö”Ô† | 820-8502 |
ŠÝ’n | •Ÿ‰ªŒ§”Ñ’ËŽsì’Ã680-4 |
Phone | 0948-29-7891 |
Fax | 0948-29-7651 |
wen (at) csn.kyutech.ac.jp | |
Web | https://www.vlab.cse.kyutech.ac.jp/~wen/index.htm |
—š—ð
1986”N | ´‰Ø‘åŠw ŒvŽZ‹@‰ÈŠw‹Zp ‘²‹Æ |
1990”N | L“‡‘åŠw HŠwŒ¤‹†‰È î•ñHŠw(CŽm) C—¹ |
1993”N | ‘åã‘åŠw HŠwŒ¤‹†‰È ‰ž—p•¨—Šw(”ŽŽm) C—¹ |
1993-1997”N | H“c‘åŠw HŠwŽ‘Œ¹Šw•” î•ñHŠw‰È uŽt |
1995-1996”N | •Ä‘ ƒEƒBƒXƒRƒ“ƒVƒ“‘åŠw “d‹CŒvŽZ‹@HŠw‰È ‹qˆõŒ¤‹†ˆõ |
1998-2003”N | •Ä‘ SynTestTechnologiesŽÐ Å‚‹ZpÓ”CŽÒiCTOj |
2004-2007”N | ‹ãBH‹Æ‘åŠw‘åŠw‰@ î•ñHŠwŒ¤‹†‰È •‹³Žö |
2007-Œ»Ý | ‹ãBH‹Æ‘åŠw‘åŠw‰@ î•ñHŠwŒ¤‹†‰È ‹³Žö |
ŽóÜ
1993”N5ŒŽ11“ú | î•ñˆ—Šw‰ï“Œ–kŽx•” •½¬5”N“xŒ¤‹†§—ãÜ |
2007”N10ŒŽ12“ú | Seventh IEEE Workshop on RTL and High Level Testing Å—DG˜_•¶Ü |
2009”N3ŒŽ17“ú | “dŽqî•ñ’ÊMŠw‰ï •½¬20”N“xî•ñEƒVƒXƒeƒ€ƒ\ƒTƒCƒGƒeƒB˜_•¶Ü |
2012”N1ŒŽ1“ú | IEEE (Institute of Electrical and Electronics Engineers) ƒtƒFƒ[ |
Œ¤‹†‹ÆÑ
ŽÐ‰ïvŒ£
’˜‘
“Á‹–
Copyright(C) 2021 Kajihara, Wen, Miyase and Holst Lab. , All rights reserved.