ATS'12




The 21st Asian Test Symposium
November 19-22, 2012,Toki Messe Niigata Convetion Center, Niigata, Japan

Information
Registration
ATS'12 Program
Visa Guide
Conference Location
Call for Papers
Paper Submission
Committees
Related Links

ATS'12 at a Glance

   Room 302 A/B Room 301 A   Room 301 B
Nov.19 (Mon.) 9:15-
12:15
Tutorial 1 (Room 301 B)
12:15-
13:45
 Lunch Time
13:45-
16:45
Tutorial 2 (Room 301 B)
18:00- Welcome Reception (Hotel Nikko Niigata 4F)
Nov.20 (Tue.) 9:30-
10:40
Plenary Session 1 (Marine Hall)
10:40-
11:00
Coffee Break
11:00-
12:20
Plenary Session 2 (Marine Hall)
12:20-
13:40
Lunch Time
13:40-
15:20
3A Industry Session
13:40-14:40
Oral @ 302A/B
14:40-15:40
Poster@ Foyer
3B Diagnosis and Debug 3C System-in-Package (SiP)/3D IC Test
15:20-
15:40
Coffee Break
15:40-
17:20
4A (Special Session 1) Quantum Informatics 4B ( Special Session 2) Dependable VLSI 4C Test Compaction/Test Quality
Nov.21 (Wed.) 9:15-
10:30
5A Temperature /
Power-Aware Test I
5B Dependable
Systems/Memory Test
5C Design Verification and Validation/Software Design for Testing
10:30-
10:50
Coffee Break
10:50-
12:30
6A Temperature /
Power-Aware Test II
6B Analog Test and High-Speed I/O Test I 6C Board and System Test
12:30-
13:30
Lunch Time
13:30-
15:10
7A(Special Session 3) Power-Aware Testing:
Present and Future
7B(Special Session 4) Post-Silicon Measurements and Tests /Analog Test and High-Speed I/O Test II 7C Panel: Boad / System Test
15:20-
22:00
Social Program
Nov.22 (Thu) 9:15-
10:30
8A Embedded Tutorial
Yield Analysis
8B Built-In Test and Built-In Characterization Technique 8C ATPG
10:30-
10:50
Coffee Break
10:50-
12:05
9A Yield Analysis and Enhancement 9B DFT/On-Line Test 9C Delay and Performance Test