|
Room 302 A/B |
Room 301 A |
Room 301 B |
Nov.19 (Mon.) |
9:15-
12:15 |
Tutorial 1 (Room 301 B) |
12:15-
13:45 |
Lunch Time |
13:45-
16:45 |
Tutorial 2 (Room 301 B) |
18:00- |
Welcome Reception (Hotel Nikko Niigata 4F) |
Nov.20 (Tue.) |
9:30-
10:40 |
Plenary Session 1 (Marine Hall) |
10:40-
11:00 |
Coffee Break |
11:00-
12:20 |
Plenary Session 2 (Marine Hall) |
12:20-
13:40 |
Lunch Time |
13:40-
15:20 |
3A Industry Session
13:40-14:40
Oral @ 302A/B
14:40-15:40
Poster@ Foyer |
3B Diagnosis and Debug |
3C System-in-Package (SiP)/3D IC Test |
15:20-
15:40 |
Coffee Break |
15:40-
17:20 |
4A (Special Session 1) Quantum Informatics |
4B ( Special Session 2) Dependable VLSI |
4C Test Compaction/Test Quality |
Nov.21 (Wed.) |
9:15-
10:30 |
5A Temperature /
Power-Aware Test I |
5B Dependable
Systems/Memory Test |
5C Design Verification and Validation/Software Design for Testing |
10:30-
10:50 |
Coffee Break |
10:50-
12:30 |
6A Temperature /
Power-Aware Test II |
6B Analog Test and High-Speed I/O Test I |
6C Board and System Test |
12:30-
13:30 |
Lunch Time |
13:30-
15:10 |
7A(Special Session 3) Power-Aware Testing:
Present and Future |
7B(Special Session 4) Post-Silicon Measurements and Tests /Analog Test and High-Speed I/O Test II |
7C Panel: Boad / System Test |
15:20-
22:00 |
Social Program |
Nov.22 (Thu) |
9:15-
10:30 |
8A Embedded Tutorial
Yield Analysis |
8B Built-In Test and Built-In Characterization Technique |
8C ATPG |
10:30-
10:50 |
Coffee Break |
10:50-
12:05 |
9A Yield Analysis and Enhancement |
9B DFT/On-Line Test |
9C Delay and Performance Test |