Currently, mesh networks are attracting attention as a next-generation broadband wireless communication infrastructure for the future society with ubiquitous access to information. Transmission and distribution of 4k video is essential to implement, for example, high quality on-demand home theater, tele-conferencing, and sharing medical data between hospitals. However, current wireless communication infrastructure are not able to provide wireless channels which are safe, secure and reliable and at the same time ensures the 1Gbps transmission rate required for 4k video streaming. Under the motto "Affordable Home-Cinema", we developed a wireless 4k video transmission system based on a mesh network. By using multiple antennas, this system is able to transmit data simultaneously to multiple terminals and with a transmission rate of more than 7Gbps, it is currently the world's fastest MIMO wireless LAN system. Based on this system, our department leads the LSI design and development necessary to deploy safe, secure and reliable high-speed communication technology.
Recent power ICs and sensor chips to control the robots and cars are required to ensure the stability of operation even in the severe environment, such as wide ambient temperature range (-40℃ 〜 125℃) and long service life (up to 20 years). In this research division, advanced circuits techniques to overcome the device characteristic fluctuations, the aging degradation of elements and severe ambient temperature conditions are developed to achieve highly reliable memory and analog LSI circuits. The circuit simulator incorporating the device aging degradation and device characteristics variation is also developed to design device variability and aging degradation immune circuits. The ratio-less SRAM technology was developed from the diversion of the design concept from the securing the margin to the margin-free. It is expected to be the breakthrough for highly reliable systems because the operation of the ratio-less SRAM is completely independent of the device characteristics.
Highly reliable LSI circuit are the foundation for a safe and secure information society. It is very important to test LSI circuits for manufacturing defects, which would disrupt the correct function of the systems in the long run. Because it is necessary to complete an accurate test tens seconds even for LSI circuits operating at frequencies in the GHz range and have tens of millions of logic elements, very sophisticated LSI testing techniques are required. This research department has been developing world-leading power safe testing techniques for high-precision delay fault test, test compression, and low-power LSI. Leading-edge LSI technology fundamentally suffers from reduced reliability due to aging. In order to use them in mission-critical systems automotive, aerospace, medical equipment, or networks, we develop designs and IP for temperature-invariant high-precision path delay measurement in order to closely monitor degradation and detect imminent failures before they affect the system.
680-4 Kawazu, Iizuka
Fukuoka, 820-8502 Japan
Kyusyu Institute of Technology
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