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Journal Review
  • TC: IEEE Transactions on Computers
  • D&T: IEEE Design and Test of Computers
  • TCAD: IEEE Transactions Computer-Aided Design of Integrated Circuits and Systems
  • TVLSI: IEEE Transactions on VLSI Systems
  • TCAS: IEEE Transactions on Circuits and Systems
  • TODAES: ACM Transactinos on Design Automation of Eletronic Systems
  • IET: IET Computers & Digital Techniques
  • VLSI-Int: VLSI Journal of Integration
  • JETTA: Journal of Electronic Testing: Theory and Applications
  • JLOPE: ASP Journal of Low Power Electronics
  • IEICE: IEICE Transactinos on Information and Systems
  • IPSJ: IPSJ Transactions on System LSI Design Methodology
  • JCST: Journal of Computer Science and Technology
  • JCSC: Journal of Circuits, Systems, and Computers
  • JETC: Journal on Emerging Technologies in Computing Systems
  • CETR: Journal of Current Engineering and Technological Research
  • CJ: The Computer Journal
  • MEJ: Microelectronics Journal
  • SWJ: Scientific World Journal
  • REAJ: Journal of Reliability Engineering Association of Japan