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• DAC: IEEE/ACM Design Automation Conference (2010-2011, 2021)

• ITC: IEEE International Test Conference (2007-2014, 2016-2020)

• ETS: IEEE European Test Symposium (2008-2021)

• ATS: IEEE Asian Test Symposium (1997-2020)

• ITC-Asia: IEEE International Test Conference in Asia (2017-2020)

• DATE: Design, Automation and Test in Europe Conference (2009-2017, 2019-2021)

• DTIS: IEEE International Conference on Design & Test of Integrated Systems in Nanoscale Technology (2006-2021)

• DFT: IEEE International Symposium on Defect and Fault Tolerance in VLSI and nanotechnology Systems (2008-2016)

• PRDC: IEEE Pacific Rim International Symposium on Dependable Computing (2009-2012)

• ICCD: IEEE International Conference on Computer Design (2008, 2014-2018)

• DELTA: IEEE International Symposium on Electronic Design, Test, & Applications (2004, 2006, 2008, 2010-2011)

• ASP-DAC: IEEE/ACM Asian and South Pacific Design Automation Conference (1997-2000, 2004-2005)

• ASICON: IEEE International Conference on ASIC (2009, 2011, 2013, 2015, 2017, 2019)

• VLSI-SoC: IFIP/IEEE International Conference on Very Large Scale Integration (2010-2013, 2021)

• ICNSC: IEEE International Conference of Networking, Sensing and Control (2010, 2012)

• VDAT: VLSI Design and Test Symposium (2009-2011)

• WRTLT: IEEE Workshop on RTL and High Level Testing (2000-2005, 2009-2011, 2013-2018, 2020)

• DATA: IEEE International Workshop on Defect and Adaptive Test Analysis (2007-2016)

• LPonTR: IEEE International Workshop on Impact of Low-Power design on Test and Reliability (2009-2012)

• ISVLSI: IEEE Computer Society Annual Symposium on VLSI (2012-2019)

• IRIC: IEEE International Reliability Innovations Conference (2013)

• LATS: IEEE Latin-American Test Symposium (2013-2016)

• GLVLSI: Great Lakes Symposium on VLSI (2013-2016)

• ATC: International Conference on Advanced Technologies for Communications (2013)

• VLSID: International Conference on VLSI Design (2014-2019)

• APCCAS: IEEE Asia Pacific Conference on Circuits and Systems (2012, 2014, 2020)

• TJCAS: Taiwan and Japan Conference on Circuits and Systems (2019)

• VLSI-DAT: International Symposium on VLSI Design, Automation, and Test (2015-2021)

• iSES: IEEE International Symposium on Smart Electronic Systems (2015-2016, 2019-2021)

• ACSS: International Doctoral Symposium on Applied Computation and Security Systems (2016-2017)

• MCSoC: IEEE International Symposium on Embedded Multicore/Many-Core Systems-on-Chip (2020-2021)

• International Workshop on Computer-Aided Design, Test, and Evaluation for Dependability (1997)