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Edited Books
- Patrick Girard, Nicola Nicolici, and Xiaoqing Wen, Power-Aware Testing and Test Strategies for Low Power Devices, Springer, New York, Nov. 2009.
- Laung-Turng Wang, Cheng-Wen Wu, and Xiaoqing Wen, VLSI Test Principles and Architectures: Design for Testability, Morgan Kaufmann, San Francisco, July 2006.
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