News

2012

2012.12.12: Prof. Wen was featured on Yumenavi, a website designed for promoting college education to high school students. The link to the page is here.

2012.11.19: A half-day tutorial titled "Power-Aware Testing and Test Strategies for Low Power Devices" was presented by Prof. P. Girard of LIRMM (France) and Prof. Wen at Asian Test Symposium, a major LSI-test-related event, in Niigata, Japan.

2012.11.16: Dr. Robert C. Aitken, R&D Fellwo of ARM, visited the Wen Lab and gave a special talk titled "Trends in Low Power Embedded Processors or How Smart Phones Can Keep Getting Smarter". The abstract of Dr. Aitken's talk is here.

2012.11.6: Prof. Wen presented a paper titled "On Pinpoint Capture Power Management in At-Speed Scan Test Generation" at International Test Conference, the largest LSI-test-related event, in Anaheim, CA, USA. This paper pioneers the concept of right-power testing, which is a paradigm shift in test power management, featuring a novel scheme that reduces or increases capture power in a pinpoint manner for (1) guaranteed capture power safety, (2) improved small-delay test capability, and (3) minimal test cost impact in at-speed scan test generation.

2012.11.4: A full-day tutorial titled "Power-Aware Testing and Test Strategies for Low Power Devices" was presented by Prof. P. Girard of LIRMM (France), Prof. N. Nicolici of McMaster University (Canada), and Prof. Wen at International Test Conference, the largest LSI-test-related event, in Anaheim, CA, USA.

2012.7.19: Prof. Wen gave an invited talk at CMOS Emerging Technologies Conference 2012 held in Vancouver, Canada. The presentation PDF file is available upon request made to wen@cse.kyutech.ac.jp.

2012.5.29: Prof. Wen gave an invited talk at European Test Symposium 2012 held in Annecy, France. The presentation PDF file is available upon request made to wen@cse.kyutech.ac.jp.

2012.5.21: Japan-Taiwan Joint Workshop on Advanced VLSI Testing was held in Fukuoka as part of a JST-sponsored research project headed by Prof. Wen and Prof. J.-L. Huang of National Taiwan University. The program of the workshop is here.

2012.4.7: Prof. Wen introduced his research projects and participated in a meeting with the Governor of Fukuoka Prefecture about promoting local LSI-related research and development activities.

2012.3.29: Prof. Wen visited School of Software at Tsinghua University in the morning, met with Prof. X. Dong and gave a talk. He also visited the State Key Laboratory of Computer Architecture at Institute of Computing Technology of Chinese Academy of Science in the afternoon, met with Prof. H. Li and Prof. Y. Hu, and gave a talk. The summary of his talk is here.

2012.3.6: Prof. T.-Y. Ho of National Cheng Kung University (Taiwan) visited the Wen Lab and gave a special talk. The abstract of Prof. Ho's talk is here.

2012.2.17: Prof. I. Polian of University of Passau (Germany) visited the Wen Lab and gave a special talk. The abstract of Prof. Polian's talk is here.

2012.1.27: Prof. K. Chakrabarty of Duke University (USA) visited the Wen Lab and gave a special talk. The abstract of Prof. Chakrabarty's talk is here.

2012.1.8: A news report about low-power test generation patents filed by Prof. Wen appeared as the top news in today' Nishi-Nippon News. The news report is available here.

2012.1.1: IEEE Board of Directors, at its November 2011 meeting, elevated Prof. Wen to IEEE Fellow, effective 1 January 2012, with the citation: for contributions to testing of integrated circuits. The list of 2012 newly elevated IEEE fellows is here.

2012.1.1: Happy New Year! May 2012 bring you and your family abundant peace, health, and happiness.