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2013
  • 2013.12.19: Prof. Wen organized the first event of a DISC workshop series targeted on exploring the possibility of developing medical diagnosis and treatment based on wearable devices. Dr. M. Hirata of Hirata Pain Clinic gave an excellent presentation on Chinese medicine practices. Some attendees also got check-up by Dr. Hirata using diagnostic sphymopalpation.
  • 2013.12.13: Prof. E. Sicard of INSA / Toulouse (France) visited the Wen Lab and gave a talk titled "3D Integrated Circuits - Impact on Eletromegnetic Compatibility". Prof. Sicard also exchanged information on student exchange programs with Prof. E. S. Otabe, Vice President of International Affairs at Kyushu Institute of Technology.
  • 2012.11.19: Prof. Wen presented a paper titled "On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST" at Asian Test Symposium, in Jiaoxi, YIlan, Taiwan. This paper pioneers the concept of capture-power-safe logic BIST (CPS-LBIST), featurign guaranteed capture power safety instead of explicit capture power reduction.
  • 2013.11.7: Prof. Wen gave an invited talk titled "Low-Power LSI Testing" at The 13th International Workshop on Microelectronics Assembling and Packaging in Fukuoka.
  • 2013.9.26: Prof. Wen gave a talk titiled "Power-Aware Testing: The Next Stage" in the Department of Computer Science and Engineering at National Sun Yat-Sen University, and participated in discussions at Prof. Li's group.
  • 2013.9.24: Prof. Wen gave a keynote speech, titled "Power-Aware Testing: The Next Stage", at Taiwan Tech and Kyutech Advanced VLSI Testing Workshop 2013 in Taipei.
  • 2013.9.18: Prof. Wen visited ASE in Kaohsiung, the leading packaging and testing company in the world.
  • 2013.9.11: Prof. C.-M. Li of National Taiwan University delivered a poster presentation at 2013 IEEE International Test Conference. This joint-work with Prof. Wen features an efficient IR-drop analysis flow to identify risky test vectors causing excessive IR-drop and a fast post-ATPG pattern modification scheme to modify risky test vectors to make them capture-safe. Test professionals from some of the largest design houses showed strong interest in this technology. A snapshot of the presentation is here.
  • 2013.8.1: A patent filed jointly by National Taiwan University (NTU) and Kyushu Institute of Technology (KIT) covering the first X-filling-based technology for reducing test power in sequential decomposer based test compression with Dr. M.-F. Wu (NTU), Prof. J.-L. Huang (NTU), Prof. Wen (KIT), and Prof. Miyase (KIT) as inventors has been registered as Taiwan Patent I403746 on August 1, 2013.
  • 2013.7.18: Prof. Wen attended the 68th FTC workshop held in Yamaguchi City from 7/18 to 7/20.
  • 2013.6.3: Prof. Wen visited Prof. E. Sicard, Professor at the Department of Electrical and Computer Engineering and Deputy Director of International Relations of INSA, Toulouse. Prof. Sicard is not only a well-established researcher in his field but he has also contributed significantly to the well-regarded international exchange programs at INSA, Toulouse. In addition, Prof. Sicard is a professionally-trained violin player.
  • 2013.5.25: Prof. Wen is one of the funding donors for a charity project, called "The Hundred Love Compassion School Project", whose mission is to build an elementary school in a remote and less-developed area in China. The idea evolved from discussions among the authors of the book as the most efficient way to utilize the book's royalties. For more information, please refer to the project's homepage.
  • 2013.5.10: A ceromony, a special talk, and a party were held to mark the formal opening of Dependable Integrated Systems Research Center (DISC) at Kyushu Institute of Technology (KIT). About 100 people attended the events, including Prof. Matsunaga (President of KIT), Prof. Nobuyama (Dean of the College of Computer Sciences and Systems Engineering), and Prof. Wen (Director of DISC). Prof. K. K. Saluja of University of Wisconsin - Madison delivered the special talk titled "Dependable Circuits and Systems: Answering Thermal Issues". The events were covered by newspaper media, including Nikkei and Nishinippon News. Here are some photos (1, 2, 3, 4, 5, 6, 7, 8, 9) taken at the DISC opening event.
  • 2013.5.9: A textbook on semiconductor circuits, co-authored by Prof. Wen, has been published and is now available in all major bookstores in Japan.
  • 2013.5.9: Prof. K. K. Saluja of the ECE Department at University of Wisconsin - Madison visited the Wen Lab and gave a special talk titled "Thermal Aware Test Scheduling: Basics and Optimal Solutions".
  • 2013.4.1: Prof. Wen was appointed Director of the newly established Dependable Integrated Systems Research Center (DISC) at Kyushu Institute of Technology. The mission of DISC is to contribute to the realization of safe, secure and sustainable information society through the research of basic and applied technologies for creating highly reliable and high-quality next-generation integrated systems.
  • 2013.3.6: Prof. Wen visited Mr. Andy Chang, Managing Director at Azio Electronics Co., Ltd., an innovative company founded in 2011 to provide best solutions in advanced semiconductors, leading-edge electronic components, and total (integrated) solutions.
  • 2013.3.5: Prof. Wen attended Japan-Taiwan Workshop on Nano Devices 2013 and made a presentation on the joint research project that is being conducted by his lab at Kyushu Institute of Technology and Prof J.-L Huang's lab at National Taiwan University.
  • 2013.1.1: Wish you and your family a happy, healthy, and peaceful 2013!