News

2018

2018.12.28: Prof. Wen visited Prof. Haiying Yuan's lab at Beijing University of Technology and gave a talk titiled "Power-Aware Testing for Low-Power VLSI Circuits".

2018.12.27: Prof. Wen gaved a keynote talk titiled "LSI Testing: A Core Technology to a Successful Semiconductor Industry" at International Conference on Advanced Mechnical and Electronical Engineering (AMEE-2018), Beijing, China.

2018.12.26: Prof. Wen visited Prof. Dong Xiang at Tsinghua University and gave an intived talk titled "All about ICs: From Technology Trends to Career Choices".

2018.11.28: Prof. Krishnendu Chakrabarty of Duke University (USA), visiting KIT as a JSPS (S) Fellow, gave an intived talk titled "Design of Fault-Tolerant Neuromorphic Computing Systems".

2018.11.22: Ms. Shainling Wu, an Instructor with Temple University (USA) visited the Wen Lab and gave an invited talk titled "Brainstorming on How Best to Educate Global Students of Electrical and Computer Engineering".

2018.11.2: Mr. Christian M. Fuchs a Ph.D. Researcher with Leiden University (The Netherlands) visited the Wen Lab and gave an invited talk titled "Enabling the Use of Fault-Tolerant Cellphone Processors aboard Satellites".

2018.10.23: Prof. Wen received a Certificate of Appreciation from IEEE Council on Electronic Design Automation in recognition of his time and effort as an Assocate Editor for the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

2018.10.18: Yucong Zhang, a Ph.D. student in the Web lab, presented a paper titled "Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing" at the 26th Asian Test Symposium, in Hefei, China.

2018.10.15: A half-day tutorial titled "Power-Aware Testing in the Era of IoT" was presented by Prof. P. Girard of LIRMM (France) and Prof. Wen at the 26th Asian Test Symposium, in Hefei, China.

2018.10.14: Prof. Wen arrived in Hefei, China, to attend the 27th Asian Test Symposium (Oct. 15-18, 2018) and the Workshop on RTL and High Level Testing (Oct. 18-19, 2018).

2018.10.2: Mr. Flroain Neugebauer, a Ph.D. Student at University of Stuttgart, Germany, arrived on KIT Iizuka Campus for a half-year research visit to the Wen Lab.

2018.9.16: Dr. Aibin Yan, a Lecturer at Anhui University, Heifei, China, arrived in Fukuoka for a one-year research visit to the Wen Lab.

2018.9.13: Prof. Wen and Prof. Hoslt met with Prof. Alex Orailoglu of University of California - San Diego in Fukuoka.

2018.9.9: Two students from the Wen Lab started a two-week research visit to National Sun-Yatsen University.

2018.8.24: Prof. Wen attended a meeting for creating a textbook on LSIs at the University of Tokyo.

2018.8.20: Prof. Wen gave a keynote titled "Power-Aware Testing for Low-Power VLSI Circuits" at the Workshop of Artificial Intelligence and Its Applications on Next Generation of Internet of Things (AINGIOT) in Kitakyushu, Japan.

2018.8.16: Prof. Wen attended the ITC-Asia 2018 in Harbin, China, as its Program Co-Chair.

2018.8.15: Dr. Aibin Yan, a research collaborator of Prof. Wen, won the Best Paper Award at the 10th China Test Conference in Harbin, China.

2018.8.5: Prof. Wen gave a keynote titled "Power-Aware Testing for Low-Power VLSI Circuits" at the 2nd International Conference on Circuits, Devices and Systems in Nanjing, China.

2018.7.27: Prof. Wen gave a talk at a Science Cafe event on the Iizuka Campus of Kyushu Institute of Technology.

2018.7.21: Mr. Harshad Dhotre, a visiting P.h. D. student from University of Bremen, gave a talk titled "Constraint-based Pattern Retargeting for Reducing Localized Power Activty during Testing" at the 79th FTC Workshop.

2018.7.20: Prof. Holst gave a talk titled "Interactive Logic Diagnosis of Unpredicted Defects in LogicCircuits" at the 79th FTC Workshop.

2018.7.19: Prof. Wen arrived at Kitsuregawa to attend the 79th FTC Workshop (Jul. 19-21, 2018).

2018.6.5: Mr. Harshad Dhotre, a P.h. D. student from University of Bremen, started his research visit (6/5/2018-8/16/2018) to the Wen Lab. His research field is low-power testing of VLSI circuits.

2018.5.31: Prof. S. Holst presented the first-ever paper on the impact of defects in a hardened latch, titled "The Impact of Production Defects on the Soft-Error Tolerance of Hardened Latches", at the 23rd IEEE European Test Symposium in Bremen, Germany.

2018.5.27: Prof. Wen attended the 23rd IEEE European Test Symposium in Bremen, Germany. Here are some snapshots: 1, 2, 3.

2018.4.18: A welcome party for the new students of the Kajihara-Wen-Miyase research group was held in Iizuka.

2018.3.29: Prof. Wen visited Beijing University of Aeronautics and Astronautics and gave an intived talk titled "Power-Aware LSI Testing: Challenges and Strategies".

2018.3.23: The graduation ceremony was held. Three master students and three undergraduate students graduated from the Wen Lab. Here is a snap taken at the ceremony.

2018.3.6: The 10th LSI Test Seminar was held in Fukuoka. Researchers and students from five universities attended this annual event.

2018.3.5: The 2018 Test Spring Seminar, organzied by DISC of Kyushu Institute of Technology, was held in Fukuoka. Two LSI test experts, Mr. Masao Aso from Syswave Corp. and Dr. Masahiro Ishida from Advantest Corp., talked about LSI test basics, advanced practices, and how to become a good LSI test engineer.

2018.2.28: A farewell party was held for graduating students from the LSI Test Research Group at Kyushu Institute of Technology.

2018.2.26: Mr. Yucong Zhang, a Ph.D. studend of the Wen Lab, received the 2017 Excellent Student Award of the IEEE Fukuoka Section.

2018.2.15: A special seminar was held at Kyutech Plaza in Fukuoka. Prof. Bernd Becker of University of Freiburg (Germany) gave an invited talk titled "Towards Automatic Construction of Algebraic Fault Attacks" at Kyutech Plaza in Fukuoka. Dr. Miyake from the LSI Test Group at Kyushu Institute of Technology also talked about his research work on digita tempurature sensors.

2018.1.22: The 5th International Symposium on Dependable Integarted Systems, organzied by DISC of Kyushu Institute of Technology, was held on the Iizuka Campus of Kyushu Institute of Technology. In the morning, Prof. Adit Singh of Auburn University, USA, gave a keynot talk titled "Has Fault Model Based Structural Test Hit a Brick Wall? Are In-System Tests Unavoidable?" and Prof. Nguyen Duc Minh of Hanoi University of Science and Technology, Vietnam, gave an invited talk titled "Interval Property Checking for Hardware Design Using Satisfiability Modulo Theories Solver". In the afternoon, eight research presentations were made from DISC.