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2019
  • 2019.11.28: Dr. Christian M. Fuchs from Leiden University (The Netherlands) visited the Wen Lab and gave a talk titled "Fault-Tolerant Satellite Computing with Modern Semiconductors".
  • 2019.10.5: Prof. Wen gave a mini-lecture on LSI reliability at YumenaviLIVE-2019, a university fair for high-school students, in Sendai, Japan.
  • 2019.9.15: Mr. Kalyan Baital, a Ph.D. student from University of Calcutta arrived in Fukuoka to start a research visit to the Wen Lab.
  • 2019.9.15: Prof. Aibin Yan, a visiting scholar from Anhui University, left Fukuoka after a one-year research visit to the Wen Lab.
  • 2019.8.11: Dr. Laung-Terng Wang, President & CEO of SynTest Techniologies, Inc. and a Visiting Professor of the Wen Lab, was selected as a 2019 Distinguished Alumnus of Taiwan University.
  • 2019.7.30: A tutorial titled "Power-Aware Testing in the Era of IoT", proposed by Dr. P. Girard (LIRMM, Fance) and Prof. Wen, was accepted as a half-day tutorial at the 50th International Test Conference (ITC-2019) to be held in Washington D.C. Nov., 2019.
  • 2019.7.11: A special educational event was held. Mr. John K. Moriwaka of Moriwaka Medical Inc., gave a motivational talk titled "How to start your startup? Silicon Valley Way of Entrepreneurship and Innovation".
  • 2019.6.25: Prof. Wen gave a tutorial titled "Power-Aware LSI Testing ~ Challenges and Strategies ~" at Korea Test Conference, Seoul, Republic of Korea.
  • 2019.6.20: Prof. Bhargab B. Bhattacharya of India Institute of Technology, Kharagpur, India, visited the KIT LSI Test Research Group and gave an intived talk titled "Predicting X-Sensitivity of Circuit-Inputs on Fault-Coverage Based on Structural Features".
  • 2019.6.17: Prof. Ashutoch Kumar Singh of National Institute of Technology, Kurukshetra, India, visited the Wen Lab and gave an intived talk titled "Testing of Reversible Circuits".
  • 2019.5.15: Prof. Jiun J Liou, Chair Professor and Director of School of Microelectronics, Zhengzhou University, visited the Wen Lab and gave an intived talk titled "Electrostatic Discharge (ESD) Protection in Emerging Technologies: Challenges and Solutions".
  • 2019.5.10: Prof. Shi-Yu Huang of National Tsinghua University visited the Wen Lab and gave an intived talk titled "Health Condition Monitoring for IoT Devices - Circuits and Methodologies -".
  • 2019.5.1: A textbook on the design and testing of semiconductor circuits "はかる×わかる半導体 応用編", co-authored by Prof. Wen, has been published and is now available in all major bookstores in Japan..
  • 2019.4.24: A welcome party for the new students of the Kajihara-Wen-Miyase research group was held in Iizuka.
  • 2019.3.6: Prof. Wen received the Outstanding Faculty Award from the President of Kyushu Institute of Technology for his significant contributions to the university.
  • 2019.3.1: A farewell party was held for graduating students from the LSI Test Research Group at Kyushu Institute of Technology.
  • 2019.2.22: S. Munagata, K. Kawabata, Y. Tonaki, and Y. Tanaka from the Wen Lab presented their bachelor theses.
  • 2019.2.13: A. Honda from the Wen Lab presented his master thesis.
  • 2019.1.24: Prof. Wen arrived in Kitakyuhsu to attend the 80th FTC workshop.
  • 2019.1.10: The new-year party of LSI Test Research Group at Kyushu Institute of Technology was held.
  • 2019.1.1: Prof. Wen was elevated to the grade of Senior Member of IEICE (Institute of Electronics, Information and Communication Engineers).
  • 2019.1.1: Wish you and your family a happy, healthy, and prosperous 2019!