News

Profile

Members

Research

Grants

Papers

Patents

Books

Talks

Services

Awards

Courses

Contact

1. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 2nd IEEE International Conference on Control, Measurement and Instrumentation, Calcutta, India, Jan. 9, 2021. Virtual Event

   ---

2. "LSI Testing: A Core Technology to a Successful Semiconductor Industry",The 8th IEEE International Symposium on Next-Generation Electronics, Zhengzhou, China, Oct. 9, 2019.

   ---

3. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", International Conference on Advanced Mechnical and Electronical Engineering, Beijing, China, Dec. 27, 2018.

   ---

4. "Power-Aware VLSI Testing -Challenges and Strategies-", The Workshop of Artificial Intelligence and Its Applications on Next Generation of Internet of Things, Kitakyushu, Japan, Aug. 20, 2018.

   ---

5. "Power-Aware Testing for Low-Power VLSI Circuits", The 2nd International Conference on Circuits, Devices and Systems, Nanjing, China, Aug. 5, 2018.

   ---

6. "Power-Aware Testing for Low-Power VLSI Circuits", The 5th Int'l Symp. on Applied Engineering and Sciences, Serdang, Malaysia, Nov. 14, 2017.

   ---

7. "Power-Aware LSI Testing: Challenges and Strategies", China Test Conference, Nantong, China, Jul. 23, 2016.

   ---

8. "Power-Aware Testing: The Next Stage", Taiwan Tech and Kyutech Advanced VLSI Testing Workshop, Taipei, Taiwan, Sep. 24, 2013.

9. ---

   "Power-Aware Test for Low-Power Devices", IEEE Workshop on RTL and High Level Testing, Shanghai, China, Dec. 5, 2010.

   ---

10. "Reliability: The Unchanging Value of the Ever-Changing Semiconductor World", IEEE Pacific Rim International Symposium on Dependable Computing, Shanghai, China, Nov. 16, 2009.

    ---

11. "Challenges and Chances in Deep-Submicron LSI Testing", China Test Conference, Suzhou, China, May 21, 2008.