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• 2011.12.16: Prof. Wen visited Prof. M. Tehranipoor at University of Connecticut and gave a talk titled "Power-Aware Testing of Low-Power VLSI Circuits" at the ECE Seminar.

• 2011.11.20: Prof. Wen gave a talk titled "The FAN (Also Fun) Impact" at the Workshop in Honor of Prof. Hideo Fujiwara, in which he highlighted Prof. Fujiwara's research philosophy.

• 2011.10.27: Prof. Wen presented an invited paper titled "Towards the Next-Generation of Low-Power Test Technologies" at 2011 IEEE 9th International Conference on ASIC (ASICON 2011).

• 2011.10.26: The Test Technology Technical Council (TTTC) of IEEE Computer Society has approved a new Technical Activity Committee on "Power-Aware Testing" with Prof. P. Girard (LIRMM) as Chair and Prof. Wen as Co-Chair.

• 2011.10.6: Prof. Wen visited Prof. Q. Xu at Hong Kong Chinese University and gave a seminar talk on low-power testing for low-power LSI circuits at Department of Computer Science and Engineering.

• 2011.10.1: Two papers, "CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing" (ATS-2009) and "Efficient BDD-based Fault Simulation in Presence of Unknown Values" (ATS-2011), co-authored by Prof. Wen and presented at Asian Test Symposium (ATS) have been selected for inclusion into ATS 20th Anniversary Compendium.

• 2011.9.21: Prof. Wen's research group presented a paper titled "A Novel Scan Segmentation Design Method for Avoiding Shift Timing Failure in Scan Testing" at IEEE International Test Conference 2011 (ITC'11) in Anaheim, USA. This paper is the first of its kind that optimizes the design of segmentation scan to minimize clock skew in clock trees during scan shift.

• 2011.9.18: Prof. Wen, together with Prof. P. Girard (LIRMM) and Prof. N. Nicolici (McMaster University), delivered a full-day tutorial at IEEE International Test Conference 2011 (ITC'11) in Anaheim, USA. The tutorial was an comprehensive coverage of basics and latest solutions for low-power testing, based on book "Power-Aware Testing and Test Strategies for Low Power Devices" co-authored/co-edited by Prof. Girard and Prof. Nicola.

• 2011.7.28: Prof. Wen presented an invited paper titled "VLSI Testing and Test Power" at Second International Green Computing Conference (IGCC'11).

• 2011.5.8: Mr. Y.-T. Lin arrived from Laboratory of Dependable Systems at National Taiwan University, starting his 4-month joint research on low-power testing with the Wen Lab.

• 2011.5.3: Prof. Wen presented a paper titled "Power-Aware Test Generation with Guaranteed Launch Safety for At-Speed Scan Testing" at VLSI Test Symposium 2011 (VTS'11), Dana Point, USA. This paper marks the beginning of the second generation of low-power test generation solutions, featuring fine-grained and power-safety-oriented test power management.

• 2011.5.2: Prof. Wen organized a panel session "How Much Toggle Activity Should We Be Testing With?" at VLSI Test Symposium 2011 (VTS'11), Dana Point, CA, USA. With panelists Dr. Kapur (Synopsys), Dr. Winemberg (Freescale), Dr. Majumdar (AMD), and Mr. Bhat (TI) and moderated Prof. Tehranipoor (UConn), this penal provided vivid discussions about critical issues in low-power testing from an industry perspective.

• 2011.4.28: Prof. Wen, Prof. Miyase, and Mr. Enokimoto filed a Japan patent application based on the rescue-and-mask technology they invented for guaranteeing test-power-safety in at-speed scan testing. The paper documenting this technology will be presented at VLSI Test Symposium 2011 (VTS'11), Dana Point, CA, USA.

• 2011.3.15: The safety of all members and their families of Wen Lab has been confirmed. We sincerely thank our friends from all over the world for their kind consideration poured in after the 3/11 earthquake and tsunami. All of us here are determined to live through this unprecedented disaster with unbreakable dignity and spirit of cooperation.

• 2011.1.24: Prof. Wen gave an invited talk titled "Low-Power Testing for Low-Power Devices" as part of the Tech Forum program at AMD R&D Center, Shanghai, China.