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• 2010.12.5: Prof. Wen delivered a keynote speech titled "Low-Power Testing for Low-Power Devices" at 11th IEEE Workshop on RTL and High Level Testing (WRTLT'10). The slide-set is now available for download.

• 2010.10.7: Prof. Wen gave an invited talk titled "Low-Power Testing for Low-Power Devices" at IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'10).

• 2010.9.13: Dr. L.-T. Wang, Founder and CEO of SynTest Technologies, Inc, Visiting Professor of Kyushu Institute of Technology, visited the Wen Lab, and gave an invited talk titled "SynTest Technology Overview for At-Speed Testing and Test Compression and Future Challenges".

• 2010.8.1: Prof. Wen conducted a full-day tutorial titled "Low-Power Testing for Low-Power Devices" with Prof. N. Nicolici at 53rd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS'10).

• 2010.7.1: Prof. S. Kundu of University of Massachusetts started his two-month visit to the Wen Lab.

• 2010.6.20: Prof. Wen conducted a half-day tutorial titled "Low-Power Testing for Low-Power Devices" with Dr. Patrick Girard and Prof. Nicola Nicolici at 9th IEEE International NEWCAS Conference (NEWCAS'10).

• 2010.6.1: Prof. Wen visited Prof. P. Girard at LIRMM for joint-research on low-power VLSI testing.

• 2010.5.28: Prof. Wen was appointed Trustee of Reliability Engineering Association of Japan.

• 2010.3.25: Mr. Michael Kochte of University of Stuttgart started his one-year research stay at the Wen Lab.

• 2010.3.20: Prof. visited Shanghai University and gave a talk titled "Challenges and Chances in Deep-Submicron LSI Testing".

• 2010.2.20: Prof. Q. Xu of Hong Kong Chinese University visited the Wen Lab.